Semiconductor/ IC Relatives

Wafer Inspection Machine

IC Package Inspection Machine

Touch Plate Defect Inspection

檢測項目：異物面積、尺寸量測

IC in Carrier Tape Defect Inspection

檢測項目：破損

Automatic Metal Contact Inspection System Die Appearance Defect Inspection

檢測項目：毛邊、破裂、座裂、偏心、橫紋等

IC Hole Defect Inspection

檢測項目：尺寸量測

Carrier Tape Defect Inspection

檢測項目：成形不良、重疊、破孔、刮傷等

IC Chip Position Inspection

檢測項目：檢測載板位置

IC Chip Laser Trimming Defect Inspection

檢測項目：邊緣切紋

IC Chip Package Defect Inspection

檢測項目：裂紋

IC Heat Sink Cover Defect Inspection

檢測項目：黃點、色澤不均、刮傷、漏底材

IC Package Inspection

檢測項目：檢測膠量塗抹均勻度

IC Surface Crack Inspection

檢測項目：裂紋

8" Wafer Defect Inspection

檢測項目：刮痕、碰傷、汙點、針孔、雜質紋等

3"-6" Wafer Defect Inspection

檢測項目：孔洞、缺角、玷汙、裂紋、變形等